Description
Sample wire harness intelligent test system is a dedicated test system for sample wire teams, independently developed by the manufacturer. The system consists of two parts: the upper computer and the lower computer. The upper computer software is responsible for monitoring and management, with comprehensive functions covering data acquisition, processing, storage, and user interaction. The lower computer hardware interacts with the detected object, accurately receiving instructions and efficiently executing test tasks. Compared to traditional detection methods, this intelligent sample wire test system has significant advantages. It not only greatly improves detection efficiency but also fully guarantees the reliability of test results. The system has been carefully designed with a user-friendly human-computer interaction interface, providing users with an intuitive and convenient operation experience. In terms of program editing, a pipeline-style workflow has been adopted, greatly facilitating employee operation and use, reducing operational difficulty, and improving work efficiency.
●Interface visualization guidance: Employees can operate easily and quickly conduct sample line loop detection;
●Data management traceability: Back-end records detection logs;
●Clear circuit indication: Connector hole positions are highlighted for guidance;
●Fully functional:Capable of printing labels, interfacing with MES management, and other functions;
●Flexible printing function: Convenient and quick setting of printing parameters;
●Automatic conversion of splice points: The virtual splice points in the circuit table are automatically converted into actual connector points for detection;
●Anti-misoperation: The functions of conduction maintenance and conduction interval time can prevent employees from misoperation during testing;
●Memory function detection: If there is a sudden power failure during the test process or if the sample line detection is not completed on the same day, the test can be resumed after powering on;
●Re-test function: Faulty circuits can be recorded and individually re-tested;